在Java中实现SIFT [英] Implementing SIFT in Java
问题描述
因此，我正在开发一个简单的Java应用程序，允许用户输入图像作为查询，并让应用程序与图像数据库（它基本上只是不同的图像的目录）进行比较。我基本上正在调查几种图像相似性测量技术，以找出哪些适合比较汽车的照片。
So I'm working on a simple Java app that allows a user to input an image as a query and have the app compare it against a database of images (which is basically no more than a directory of different images). I'm basically investigating several image similarity measurement techniques to find out which ones are appropriate for comparing pictures of cars.
我已经做了一些阅读，除了FFT / SSIM，我看到SIFT算法可以产生非常好的结果。但是，作为只有大约一年的基本Java经验的人，我真的不知道我是否是一个足够好的程序员，以能够实现它。地狱，我仍然无法理解算法的核心概念，因为它显而易见的复杂性。
I've been doing some reading and apart from FFT/SSIM, I've read that the SIFT algorithm can yield very good results. However, as someone with only about a year's worth of basic Java experience, I'm honestly not sure if I'm a good enough programmer to be able to implement it. Hell, I'm still having trouble understanding the core concepts of the algorithm due to it's apparent complexity.
所以我想请求那些比我更多的经验。它是否甚至实用的第一地实现SIFT为此目的？我可以用JDK单独（没有其他插件，如果可能的话）？
So I'd like to ask those with much more experience than me. Is it even practical in the first place to implement SIFT for such purpose? Could I do it with the JDK alone (no other addons, if even possible)? How would I go about doing it?
提前感谢
推荐答案
扩展ImageJ的Fiji图像处理软件包有一个维基网站，其中包含SIFT插件的信息：
The Fiji image processing package, which extends ImageJ, has a wiki website with information on its SIFT plugin:
http://pacific.mpi-cbg.de/wiki/index.php/Feature_Extraction
在java中的SIFT实现的源代码在mpicbg.git存储库中可用：
The source code of the SIFT implementation in java is available in the mpicbg.git repository:
http://pacific.mpi-cbg.de/cgi-bin/gitweb.cgi?p=mpicbg.git
包含SIFT特征提取和特征匹配的库是下载Fiji时的Fiji.app/jars/文件夹下的mpicbg.jar。
The library that includes the SIFT feature extraction and feature matching is the mpicbg.jar, under Fiji.app/jars/ folder when you download Fiji.
斐济可以从这里下载：
http://pacific.mpi-cbg.de/wiki/index.php/下载
SIFT插件的使用示例连续切片在电子显微镜堆叠中的配准。查看此页：
An example of usage of the SIFT plugin is the registration of consecutive slices in an electron microscopy stack. See this page:
http：// pacific .mpi-cbg.de / wiki / index.php / Register_Virtual_Stack_Slices
源代码将教你如何使用库进行SIFT特征提取和从匹配特征集计算变换模型：
The source code will teach you how to use the library for SIFT feature extraction and for computing transformation models from sets of matching features:
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